An Optimized Rotational Position Encoding for 1-D Convolutional Transformer Hybrid Neural Network Fault Diagnosis on Power Converters

Samuela Rokocakau, Giulia Tresca, Farnoush Shamsazad, Pericle Zanchetta, Giansalvo Cirrincione, Maurizio Cirrincione

Research output: Chapter in Book/Report/Conference proceedingConference Paper published in Proceedingspeer-review

1 Citation (Scopus)

Abstract

The rotational position encoder is here adopted and optimized on a 1-D Convolutional Transformer Hybrid Neural Network model for fault diagnostics on power converters. The effectiveness of the proposed algorithm is validated on two different Cascaded H-Bridge (CHB) topologies: a 3-level and a 7-level configuration, thereby testing its scalability to systems with a higher number of switches. The evaluation focuses not only on classification accuracy but also on model robustness and reduction in model size. Given the inherent complexity of power converter topologies, the results demonstrate that the proposed model effectively processes dynamic time-series signals to detect and localize open-switch faults. The performance of both binary and multi-class classifiers confirms the algorithm's capability across varying fault scenarios and converter configurations.

Original languageEnglish
Title of host publication2025 IEEE Industry Applications Society Annual Meeting, IAS 2025
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages1-7
Number of pages7
ISBN (Electronic)9781665457767
ISBN (Print)978-1-6654-5777-4
DOIs
Publication statusPublished - Jul 2025
Event2025 IEEE Industry Applications Society Annual Meeting, IAS 2025 - Taipei, Taiwan, Province of China
Duration: 15 Jun 202520 Jun 2025

Publication series

NameConference Record - IAS Annual Meeting (IEEE Industry Applications Society)
ISSN (Print)0197-2618

Conference

Conference2025 IEEE Industry Applications Society Annual Meeting, IAS 2025
Country/TerritoryTaiwan, Province of China
CityTaipei
Period15/06/2520/06/25

Bibliographical note

Publisher Copyright:
© 2025 IEEE.

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