Assessment of the influence of charged dangling bonds on the short circuit current in amorphous silicon solar cells

Alagumalai Thilagam, Jai Singh

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    Abstract

    A theoretical study of the charged dangling bonds in p-i-n amorphous silicon (a-Si:H) solar cells is presented. An improved analytical expression of the bulk collection efficiency is derived incorporating charged dangling bonds. It is used in calculating the short circuit current employing the admittance analysis method to study the effect of D+ and D- states. The method is extended to obtain results when the generation of charge carriers in the i-layer is dependent on position. The theory is general and can be applied to any multi-layered device structure.

    Original languageEnglish
    Pages (from-to)66-72
    Number of pages7
    JournalJournal of Non-Crystalline Solids
    Volume288
    Issue number1-3
    DOIs
    Publication statusPublished - Aug 2001

    Bibliographical note

    Funding Information:
    This work was supported by the Australian Research Council's (ARC) small grant scheme. One of us (A. Thilagam) is thankful to Dr P. Stulik for useful suggestions.

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