Digital In-Line Holography and Applications

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

[No abstract available]
Original languageEnglish
Title of host publicationDigital Holography for MEMS and Microsystem Metrology
EditorsA. Asundi
Place of PublicationUnited States
PublisherJohn Wiley & Sons
Chapter4
Pages109-138
Number of pages30
ISBN (Print)9780470978696
DOIs
Publication statusPublished - 5 Jul 2011
Externally publishedYes

Publication series

NameMicrosystem and Nanotechnology
PublisherJohn Wiley & Sons

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