Digital In-Line Holography and Applications

Research output: Chapter in Book/Report/Conference proceedingChapterResearchpeer-review

Abstract

[No abstract available]
Original languageEnglish
Title of host publicationDigital Holography for MEMS and Microsystem Metrology
EditorsA. Asundi
Place of PublicationUnited States
PublisherJohn Wiley & Sons
Chapter4
Pages109-138
Number of pages30
ISBN (Print)9780470978696
DOIs
Publication statusPublished - 5 Jul 2011
Externally publishedYes

Publication series

NameMicrosystem and Nanotechnology
PublisherJohn Wiley & Sons

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Holography

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Khanam, T. (2011). Digital In-Line Holography and Applications. In A. Asundi (Ed.), Digital Holography for MEMS and Microsystem Metrology (pp. 109-138). (Microsystem and Nanotechnology). United States: John Wiley & Sons. https://doi.org/10.1002/9781119997290.ch4
Khanam, Taslima. / Digital In-Line Holography and Applications. Digital Holography for MEMS and Microsystem Metrology. editor / A. Asundi. United States : John Wiley & Sons, 2011. pp. 109-138 (Microsystem and Nanotechnology).
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title = "Digital In-Line Holography and Applications",
abstract = "[No abstract available]",
keywords = "2D measurement method - validation and performance, 3D point cloud algorithm performance - and superimposition method, analyzed, Application, of lens-less digital in-line holography - for particle measurement, Digital in-line holography - optical wave field, recording and reconstruction, Digital in-line holography and applications - particle and powder technology, Holography, novel tool - overcoming limitations, of classical imaging techniques, Methodology for 3D measurement of micro-fibers - and particle measurement, Methodology, for 2D measurement of micro-particles, Quality production, of industries - controlled size and particle shape, Scanning election microscope (SEM) - particle images, from same population",
author = "Taslima Khanam",
year = "2011",
month = "7",
day = "5",
doi = "10.1002/9781119997290.ch4",
language = "English",
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publisher = "John Wiley & Sons",
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editor = "A. Asundi",
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address = "United States",

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Khanam, T 2011, Digital In-Line Holography and Applications. in A Asundi (ed.), Digital Holography for MEMS and Microsystem Metrology. Microsystem and Nanotechnology, John Wiley & Sons, United States, pp. 109-138. https://doi.org/10.1002/9781119997290.ch4

Digital In-Line Holography and Applications. / Khanam, Taslima.

Digital Holography for MEMS and Microsystem Metrology. ed. / A. Asundi. United States : John Wiley & Sons, 2011. p. 109-138 (Microsystem and Nanotechnology).

Research output: Chapter in Book/Report/Conference proceedingChapterResearchpeer-review

TY - CHAP

T1 - Digital In-Line Holography and Applications

AU - Khanam, Taslima

PY - 2011/7/5

Y1 - 2011/7/5

N2 - [No abstract available]

AB - [No abstract available]

KW - 2D measurement method - validation and performance

KW - 3D point cloud algorithm performance - and superimposition method, analyzed

KW - Application, of lens-less digital in-line holography - for particle measurement

KW - Digital in-line holography - optical wave field, recording and reconstruction

KW - Digital in-line holography and applications - particle and powder technology

KW - Holography, novel tool - overcoming limitations, of classical imaging techniques

KW - Methodology for 3D measurement of micro-fibers - and particle measurement

KW - Methodology, for 2D measurement of micro-particles

KW - Quality production, of industries - controlled size and particle shape

KW - Scanning election microscope (SEM) - particle images, from same population

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DO - 10.1002/9781119997290.ch4

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T3 - Microsystem and Nanotechnology

SP - 109

EP - 138

BT - Digital Holography for MEMS and Microsystem Metrology

A2 - Asundi, A.

PB - John Wiley & Sons

CY - United States

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Khanam T. Digital In-Line Holography and Applications. In Asundi A, editor, Digital Holography for MEMS and Microsystem Metrology. United States: John Wiley & Sons. 2011. p. 109-138. (Microsystem and Nanotechnology). https://doi.org/10.1002/9781119997290.ch4