Digital In-Line Holography and Applications

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

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Original languageEnglish
Title of host publicationDigital Holography for MEMS and Microsystem Metrology
EditorsA. Asundi
Place of PublicationUnited States
PublisherJohn Wiley & Sons
Chapter4
Pages109-138
Number of pages30
ISBN (Print)9780470978696
DOIs
Publication statusPublished - 5 Jul 2011
Externally publishedYes

Publication series

NameMicrosystem and Nanotechnology
PublisherJohn Wiley & Sons

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Khanam, T. (2011). Digital In-Line Holography and Applications. In A. Asundi (Ed.), Digital Holography for MEMS and Microsystem Metrology (pp. 109-138). (Microsystem and Nanotechnology). John Wiley & Sons. https://doi.org/10.1002/9781119997290.ch4