Electroluminescence Analysis For Separation of Series Resistance From Recombination Effects in Silicon Solar Cells with Interdigitated Back Contact Design

Dian Wang, Naveen Kumar Elumalai, Md Arafat Mahmud, Mushfika Baishakhi Upama, Matthew Wright, Kah Howe Chan, Cheng Xu, Ashraf Uddin

Research output: Chapter in Book/Report/Conference proceedingConference Paper published in Proceedingspeer-review

Abstract

The effect of electron transportation layer (ETL) PCBM film thickness was investigated for the performance of inverted structure perovskite solar cells. The charge transportation study was carried by Mott-Schottky analysis. The result shows the charge transportation status of different electron thickness. A thicker PCBM layer could provide better diode property, while the thinner layer would lead to higher short circuit current. For this perovskite fabrication method, the thicker film worked better. This study reveals the optimization of PCBM depends on various factors, like cathode, and perovskite films. To further improve the efficiency of devices, the perovskite film and the design of device structure are needed to be optimized.

Original languageEnglish
Title of host publication2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
Place of PublicationPiscataway, NJ
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages2667-2671
Number of pages5
ISBN (Electronic)9781509056057
DOIs
Publication statusPublished - 2017
Event44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
Duration: 25 Jun 201730 Jun 2017

Publication series

Name2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

Conference

Conference44th IEEE Photovoltaic Specialist Conference, PVSC 2017
Country/TerritoryUnited States
CityWashington
Period25/06/1730/06/17

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