@inproceedings{dd227ecd93974c29b05f1940d4d5b6de,
title = "Electroluminescence Analysis For Separation of Series Resistance From Recombination Effects in Silicon Solar Cells with Interdigitated Back Contact Design",
abstract = "The effect of electron transportation layer (ETL) PCBM film thickness was investigated for the performance of inverted structure perovskite solar cells. The charge transportation study was carried by Mott-Schottky analysis. The result shows the charge transportation status of different electron thickness. A thicker PCBM layer could provide better diode property, while the thinner layer would lead to higher short circuit current. For this perovskite fabrication method, the thicker film worked better. This study reveals the optimization of PCBM depends on various factors, like cathode, and perovskite films. To further improve the efficiency of devices, the perovskite film and the design of device structure are needed to be optimized.",
keywords = "Inverted perovskite solar cells, Mix halide, PCBM",
author = "Dian Wang and Elumalai, {Naveen Kumar} and Mahmud, {Md Arafat} and Upama, {Mushfika Baishakhi} and Matthew Wright and Chan, {Kah Howe} and Cheng Xu and Ashraf Uddin",
year = "2017",
doi = "10.1109/PVSC.2016.7749907",
language = "English",
series = "2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017",
publisher = "IEEE, Institute of Electrical and Electronics Engineers",
pages = "2667--2671",
booktitle = "2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017",
address = "United States",
note = "44th IEEE Photovoltaic Specialist Conference, PVSC 2017 ; Conference date: 25-06-2017 Through 30-06-2017",
}