Original language | English |
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Pages (from-to) | 1117-1128 |
Number of pages | 12 |
Journal | Biometrics |
Volume | 50 |
Issue number | 4 |
DOIs |
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Publication status | Published - 1994 |
Influence Diagnostics for Generalized Linear Measurement Error Models
Yuejun Zhao, Andy H. Lee, Yer Van Hui
Research output: Contribution to journal › Comment/debate