On-line digital holographic measurement of size and shape of microparticles for crystallization processes

Taslima Khanam, Emmanouil Darakis, Arvind Rajendran, Vinay Kariwala, Anand K. Asundi, Thomas J. Naughton

Research output: Chapter in Book/Report/Conference proceedingConference Paper published in Proceedings

Abstract

Crystallization is a widely used chemical process that finds applications in pharmaceutical industries. In an industrial crystallization process, it is not only important to produce pure crystals but also to control the shape and size of the crystals, as they affect the efficiency of downstream processes and the dissolution property of the drug. The effectiveness of control algorithms depend on the availability of on-line, real-time information about these critical properties. In this paper, we investigate the use of lens-less in-line digital holographic microscopy for size and shape measurements for crystallization processes. For this purpose, we use non-crystalline spherical microparticles and carbon fibers with known sizes present in a liquid suspension as test systems. We propose an algorithm to extract size and shape information for a population of microparticles from the experimentally recorded digital holograms. The measurements obtained from the proposed method show good agreement with the corresponding known size and shape of the particles.

Original languageEnglish
Title of host publicationNinth International Symposium on Laser Metrology
Pages1-10
Number of pages10
Volume7155
DOIs
Publication statusPublished - 17 Dec 2008
Externally publishedYes
Event9th International Symposium on Laser Metrology - , Singapore
Duration: 30 Jun 20082 Jul 2008

Conference

Conference9th International Symposium on Laser Metrology
CountrySingapore
Period30/06/082/07/08

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    Khanam, T., Darakis, E., Rajendran, A., Kariwala, V., Asundi, A. K., & Naughton, T. J. (2008). On-line digital holographic measurement of size and shape of microparticles for crystallization processes. In Ninth International Symposium on Laser Metrology (Vol. 7155, pp. 1-10). [71551K] https://doi.org/10.1117/12.814557