TY - JOUR
T1 - Photo-degradation of high efficiency fullerene-free polymer solar cells
AU - Upama, Mushfika Baishakhi
AU - Wright, Matthew
AU - Mahmud, Md Arafat
AU - Elumalai, Naveen Kumar
AU - Soufiani, Arman Mahboubi
AU - Wang, Dian
AU - Xu, Cheng
AU - Uddin, Ashraf
PY - 2017
Y1 - 2017
N2 - Polymer solar cells are a promising technology for the commercialization of low cost, large scale organic solar cells. With the evolution of high efficiency (>13%) non-fullerene polymer solar cells, the stability of the cells has become a crucial parameter to be considered. Among the several degradation mechanisms of polymer solar cells, burn-in photo-degradation is relatively less studied. Herein, we present the first systematic study of photo-degradation of novel PBDB-T:ITIC fullerene-free polymer solar cells. The thermally treated and as-prepared PBDB-T:ITIC solar cells were exposed to continuous 1 sun illumination for 5 hours. The aged devices exhibited rapid losses in the short-circuit current density and fill factor. The severe short-circuit current and fill factor burn in losses were attributed to trap mediated charge recombination, as evidenced by an increase in Urbach energy for aged devices.
AB - Polymer solar cells are a promising technology for the commercialization of low cost, large scale organic solar cells. With the evolution of high efficiency (>13%) non-fullerene polymer solar cells, the stability of the cells has become a crucial parameter to be considered. Among the several degradation mechanisms of polymer solar cells, burn-in photo-degradation is relatively less studied. Herein, we present the first systematic study of photo-degradation of novel PBDB-T:ITIC fullerene-free polymer solar cells. The thermally treated and as-prepared PBDB-T:ITIC solar cells were exposed to continuous 1 sun illumination for 5 hours. The aged devices exhibited rapid losses in the short-circuit current density and fill factor. The severe short-circuit current and fill factor burn in losses were attributed to trap mediated charge recombination, as evidenced by an increase in Urbach energy for aged devices.
UR - http://www.scopus.com/inward/record.url?scp=85038369400&partnerID=8YFLogxK
U2 - 10.1039/c7nr06151j
DO - 10.1039/c7nr06151j
M3 - Article
VL - 9
SP - 18788
EP - 18797
JO - Nanoscale
JF - Nanoscale
SN - 2040-3364
IS - 47
ER -